CURRICULUM VITAE

Michael Matthew John TREACY

 

PERSONAL & GENERAL

 

Home Address:               140 West Courtney Lane,                             Phone: (480) 598-9021

                                    Tempe, Arizona 85284-3911.                        email: mike_treacy@mac.com

 

Date & Place of Birth:                     13th October 1954                       Londonderry, N. Ireland

 

Nationality:                                   Naturalized United States Citizen

 

EDUCATION

 

Cambridge University, St John’s College, U.K.

1980     Ph.D. (Cavendish Laboratory). Thesis Title: “Electron Microscopy of Palladium and Platinum Catalysts”. Supervisor, Dr. A. Howie.

1976     B.A. Hons. 2.1 Natural Sciences (Theoretical and Experimental Physics). Dissertation: “Dynamics of the Earth–Moon System”. Supervisor, Prof. A. H. Cook.

St. John’s College, Southsea, U.K.

1971     10  ‘O’ levels (six grade 1 passes).

1973     3 ‘A’ levels (three grade A passes), Distinctions in Physics and Mathematics.

 

 

PROFESSIONAL POSITIONS AND EXPERIENCE

 

6/2003–present                 Professor, Dept of Physics & Astronomy

                                      Arizona State University, AZ, USA

10/1990–11/2002              Senior Research Scientist

                                      NEC Research Institute, Inc., Princeton, N.J., USA

9/1984–10/1990                Staff Physicist                                                                                                   Exxon Research & Engineering Co, Corporate Research, N.J., USA

9/1982–8/1984                 Senior Physicist           

                                      Exxon Chemical Company, Aromatics Technology Division, N.J., USA

4/1981–8/1982                 Ingénieur (Grade II)                                                                                            Centre National d’Etudes des Télécommunications, Bagneux, Paris

1/1980–3/1981                 IBM World Trade Post–Doctoral Position,                                                             IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y., USA

 

ORGANIZATIONAL EXPERIENCE

 

   Co–Organizer of the Materials Research Society Symposium on “Microstructure and Properties of Catalysts” Editor  Proceedings, Vol. No. 111. (12/1987)

   Meeting Chair 1991 Materials Research Society Fall meeting, with M. Yoo (Oak Ridge) & J. Phillips (Bell Labs).

   Treasurer, program committee, Editor, 9th International Zeolite Conference, Montréal, 6/1992.

   Chairman of the Structure Commission of the International Zeolite Association.

   Member of the Council of the International Zeolite Association.

   Member (retired) of the Steering Committee of the National Center for Electron Microscopy (1989–1994).

   Treasurer, Editor, for the 12th International Zeolite Conference, Baltimore, 6/1998.

   Meeting Chair of Gordon Research Conference on “Zeolites and Layered Clays” 6/2002.

 

 

 

AWARDS

Wright Award 1974. Awarded by St. John’s College Cambridge, for academic excellence.

Best Biological Poster at the 1995 Microscopy Society of America conference (best out of 160).

Barrer Award 1990. Awarded triennially by the Royal Society of Chemistry to a young scientist under age 36, for distinguished work in the area of zeolites.

Donald W. Breck Award 1996. Awarded triennially by the International Zeolite Association for the most significant contribution to molecular sieve science and technology during that 3-year period – for elucidating fault structures in FAU/EMT zeolites.

 

RESEARCH GRANTS

   NSF GOALI grant DMR 97-03906, co-Principal Investigator with J. M. Gibson at U. Illinois, supporting student Paul Voyles. “Atomic Correlations in Disordered Materials observed using Variable Coherence Transmission Electron Microscopy”. $221,000.

 

   NSF GOALI grant DMR 00-74273, co-Principal Investigator with P. J. Keblinski at Rensselaer Polytechnic, supporting students R. Kishora-Dash and Juyin Cheng. “Structure of Amorphous Materials by Fluctuation Microscopy and Atomic-level Simulation”. $240,000

 

RESEARCH HIGHLIGHTS

 

     Proposed, and demonstrated, the high-angle annular detector for STEM Z contrast

My Ph.D. work was on the development of advanced TEM-based techniques for the characterization of supported Pt and Pd catalysts. At that time, Crewe’s Z contrast technique seemed ideal for detecting high atomic number (Z) elements such as Pt, on low atomic number supports that are typical of supported catalysts. I demonstrated that diffraction produced stronger contrast that overwhelmed the Z-contrast effect in crystals. In collaboration with supervisors A. Howie and L. M. Brown, I showed that upon increasing the annular detector inner collection angle, diffraction contrast could be suppressed. Further, the Z-dependence of the signal improved to Z2 because atomic screening effects are diminished. (This seemingly simple experiment required time and some considerable ingenuity to overcome design limitations in the early STEM instruments.) In later work, I demonstrated single Pt atom sensitivity in zeolites. I also showed that high angle annular dark field intensities could be used to estimate sub-nanometer particle sizes reliably. The high-angle annular detector is now a standard tool in (S)TEM studies of materials.

 

     Identified a new deactivation mechanism in Pt/K-zeolite L aromatization catalysts

My STEM Z contrast studies of Pt particles in the one-dimensional channels of zeolite L revealed that Pt particles agglomerate slowly with reaction time. The particles remain sufficiently small that over 90% of the Pt atoms reside on particle surfaces. However, double-blockages in the zeolite channels effectively entomb a significant channel volume, and the loss of active Pt can be severe. I proposed a length-loading criterion for maintaining activity. The criterion is simple: there should not be enough Pt per channel to form two or more significant blockages. This hypothesis was confirmed when zeolite L supports with shorter channel lengths, but identical Pt loading, were tested. For proprietary reasons this work (1982–1985), which represents the culmination of my early Z contrast work, was published only in 1999. I won the prestigious Barrer Award (awarded triennially by the British Zeolite Association) in 1990 for part of this work.

 

     Demonstrated the dominant role of elastic relaxation in TEM images of composition-modulated films

My work at CNET in Paris was on spinodal decomposition of InGaAsP semi-conductors, which are used as photodiodes in fiber-optic telecommunications. Electron microscopy revealed pronounced quasi-periodic image contrasts that were traditionally ascribed to local composition fluctuations. In collaboration with J. M. Gibson and A. Howie, I showed that the contrast is primarily due to the bending of lattice planes near surfaces, which is induced by relaxation of stresses arising from the modulation in unit cell dimensions. Such bending produces strong diffraction contrasts. I derived equations for the bending, which remain useful for studies of strain modulation in all types of modulated thin films, from superlattices to ferroelectrics. This work also showed how to convert TEM lattice spacings into a local composition, allowing for the relaxed tetragonal distortions and their dependence on thickness.

 

 

 

     Unraveled the structure of chiral zeolite beta

Synthetic zeolite beta was first reported by Mobil in the mid 1960s. Its structure remained a mystery for over 20 years. The presence of planar faults in the sub-micron sized crystallites made it essentially impossible to solve the structure by conventional structure-refining methods. Using TEM to extract structure projections and the symmetry elements, in collaboration with J. M. Newsam, I showed that the structure comprises intimately intergrown right- and left-handed variants of a chiral tetragonal framework. (It later transpired that J. B. Higgins at Mobil had solved the structure 3 years earlier by model-building, but had not been allowed to publish.) The zeolite beta structure is important because it is a 3-dimensional 12-ring framework, with helical channels running along the c-axis. Nobody has synthesized the pure right- or left-handed forms yet, but such a pure end-member structure may have applications in chiral separations. The methods I used, and the tools I created, in this work have been used by other researchers for structure determinations of other intergrown zeolite families.

 

     Invented recursion algorithm for computing diffraction from faulted crystals – DIFFaX

During the course of the zeolite beta work, I developed a recursion method of computing powder x-ray diffraction patterns in the presence of planar faults. This tool helped provide the crucial evidence supporting our model of zeolite beta. I am the primary author of the computer program DIFFaX, which has now become a standard tool for simulation of diffraction in planar-faulted crystals, and has been used widely by other researchers for over 10 years. I have used it successfully in many projects to identify fault patterns in layered crystal systems. The Fortran DIFFaX source code, with manual, is in the public domain.

 

     Characterization of stacking fault patterns in faujasitic zeolites using TEM and DIFFaX simulations

The tools I developed for studying zeolite beta where applied to studying the faulting distributions in the various faujasite-related synthetic zeolites, ranging from pure cubic FAU framework to the pure hexagonal EMT framework. Using TEM and DIFFaX, I showed that the faulting in these materials is clustered. Using the strain relaxation model, I showed that the strains associated with the stacking faults were reduced when faults were clustered. I won the prestigious Breck Award (awarded triennially by the International Zeolite Association) in 1996 for this work.

 

     Combinatorial computer method for enumerating zeolite frameworks

In collaboration with computer scientists K. Randall and S. Rao, I built a computer program to carry out a combinatorial search over every possible crystallographic graph in order to extract all of the 4-connected periodic zeolitic graphs. For one unique tetrahedral atom there are over 6,400 4-connected graphs, of which about 200 refine to regular tetrahedral topology. This work took over 10 years to bring to fruition, and discovered many new theoretical zeolite frameworks, and revealed some interesting idiosyncrasies in the International Tables for Crystallography. This work remains active in a new collaboration with I. Rivin and E. Balkovski.

 

     Fluctuation Microscopy: A powerful TEM technique for revealing medium-range order in amorphous materials.

In collaboration with J. M. Gibson, we have shown that statistical analysis of the speckle observed in dark-field images of amorphous materials provides a measure of medium-range order. We have called this new analytical TEM technique Fluctuation Microscopy.

We have used fluctuation microscopy to solve some long-standing problems in amorphous materials. We have shown that as-deposited amorphous germanium and silicon films contain paracrystalline regions. On annealing below the recrystallization temperature, Ge (but not Si) transforms to the lower-energy continuous random network. We have also shown that amorphous hydrogenated silicon (a-Si:H) undergoes a significant structural re-arrangement on light-soaking – an observation that may lead to an improved understanding of the Staebler-Wronski effect which currently limits the efficiency of a-Si:H solar cells. Fluctuation microscopy is now being used in several laboratories. This work is in progress.

 

     Schläfli cluster methods for modeling amorphous tetrahedral models.

Borrowing from my work on zeolite topologies, I have developed a simple topological tool for investigating medium-range order in models of amorphous tetrahedral semiconductors. Schläfli clusters are compact topological descriptors of the local connectivity around each atom. (It later emerged that they are similar to the earlier “local cluster” concept of L. W. Hobbs et al.) I have proposed that the diamond Schläfli cluster is the minimum atomic configuration that can be called “topologically cubic”. Searching for such clusters is a fast effective tool for detecting medium range order in models of amorphous semiconductors. This work is in progress.

 

     In-situ TEM observations of domain switching in ferroelectric thin films.

In collaboration with A. Krishnan, we made in-situ TEM observations of domain wall motion in thin single crystal ferroelectric materials under applied electric fields. I designed, and had built, a special TEM specimen holder that can heat, apply electric fields and shine light onto a sample. Our observations showed that domain walls do not move as rigid membranes. Instead, we proposed that domain walls move by allowing charged ripples to propagate along them. We developed a simple Landau-Ginsburg Free energy argument showing that ripples have a reduced barrier to switching. Ripples enable wall motion by a mechanism analogous to that for dislocation motion in crystal slip. We also showed that some domain walls are locked under certain electric field directions, representing an inherent contribution to ferroelectric fatigue and imprint. This work is still active.

 

     Developed an effective dynamical diffraction Bloch wave explanation for the anomalous transmission of light through thin hole arrays.

When light is shone on a thin metallic film, which has a periodic array of sub-optical wavelength diameter holes drilled through it, anomalously high intensities are transmitted at certain wavelengths. That is, more light gets through than would be expected from the hole area. The current popular explanation is that surface plasmons “guide” the light through the holes. I have developed an alternative dynamical diffraction Bloch wave theory that completely explains the anomalous transmission, and does so without resorting to special pleading about surface plasmons. The theory is fully general for 3-dimensional periodic gratings, and unlike the other theories, makes no simplifications or approximations to Maxwell’s equations. This work is in progress.

 

     Exploited thermal vibrations to measure Young’s modulus of carbon nanotubes

Long carbon nanotubes that extend over holes in a TEM support film, cannot be imaged clearly at their tips because of vibrations. The vibration amplitude at the tip can be several nanometers, and this blurring motion is normally a problem for high-resolution TEM studies. I realized that the vibrations are elastically relaxed phonons and represent heat motion. By measuring the r.m.s. vibration amplitude as a function of temperature, I estimated the Young’s modulus to be ~1.8 teraPascal, which makes carbon nanotubes the stiffest known material. Later, in collaboration with T. W. Ebbesen, A. Krishnan and E. DuJardin, we applied this method to single-walled nanotubes and obtained values of 1.2 TPa, which we believe are closer to the correct value. In collaboration with P. Yianilos, I developed a hidden-parameter-inferencing technique to improve and quantify the accuracy of the method. This unique application of TEM attracted international attention, including highlights in Physics Today, C&E News, New Scientist, Bild der Wissenschaft etc…

 

     Designability of graphitic carbon cones.

In collaboration with Ebbesen, Krishnan and DuJardin, we described in the journal Nature a special carbon black sample that comprised a high density of graphitic disks and cones. Our TEM analysis confirmed that the five topologically-allowed conical forms all occur, but with a preponderance of the 60° cone-angle variety. I explain this distribution with a simple model of graphitization. I point out that there are many more ways to circumscribe carbon rings around the tip of a cone than there are ways to imbed the same rings in planar graphite. For topologically flexible seeds, graphitic cones are more “designable” than planar graphite. With an assumed seed distribution, the model explains the observed cone distribution – highlighting the role of entropy in the formation of curved graphitic structures.

 

Refereed Journal Articles

(1)      L. A. Freeman, A. Howie and M. M. J. Treacy,
Bright Field and Hollow-cone Dark-Field Electron Microscopy of Palladium and Platinum Catalysts,
J. Microsc., 111 165–178 (1977).

(2)      M. M. J. Treacy, A. Howie and C. J. Wilson,
Z Contrast of Platinum and Palladium Catalysts,
Philos. Mag.
, A38 569–585 (1978).

(3)      M. M. J. Treacy and A. Howie,
Contrast Effects in the Transmission Electron Microscopy of Supported Crystalline Catalyst Particles
J. Catal.
, 63 265–269 (1980).

(4)      M. M. J. Treacy, W. Krakow, D. A. Smith and G. Trafas,
A Technique For Comparing the Bulk and Surface Structure of Defects in Thin Films Using the Scanning Transmission Electron Microscope,
Appl. Phys. Letts.
, 38 341–345 (1981).

(5)      M. M. J. Treacy,
Imaging With Rutherford Scattered Electrons in the STEM,
Scanning Electron Microsc.
, 1 185–197 (1981).

(6)      D. A. Smith and M. M. J. Treacy,
Low-Loss Surface Imaging and Transmission Electron Microscopy of Growth of Some Thin Films,
Applications of Surface Science
, 11/12 131–143 (1982).

(7)      M. M. J. Treacy,
Optimizing Atomic Number Contrast in Annular Dark Field Images of Thin Films in the Scanning Transmission Electron Microscope,
J. Microsc. Spectrosc. Eléctron.
, 7 511–523, (1982).

(8)      F. Glas, M. M. J. Treacy, M. Quillec and H. Launois,
Interface Spinodal Decomposition in LPE InGaAsP Lattice-Matched to InP,
J. de Physique
, 43 C5 11–16 (1982).

(9)      C. Colliex and M. M. J. Treacy,
Le Microscope Eléctronique à Balayage et en Transmission, ou STEM,
in Microscopie Eléctronique en Science des Materiaux
, ed. by B. Jouffrey, A. Bourret and C. Colliex, CNRS Publication (Paris) 391–424 (1983).

(10)    M. M. J. Treacy and J. Bellessa,
On the Measurement of Surface Step Heights by Low-Loss Imaging in STEM,
Ultramicroscopy
, 11 173–178 (1983).

(11)    M. M. J. Treacy,
Atomic Number Imaging of Supported Catalyst Particles Using the Scanning Transmission Electron Microscope,
in Catalytic Materials: Relationship Between Structure and Activity
, ed. by T. E. Whyte, R. A. Dalla Betta, E. G. Derouane and R. T. K. Baker, ACS Symposium Series No. 248 367–383 (1984).

(12)    J. M. Gibson and M. M. J. Treacy,
The Effect of Elastic Relaxation on the Local Structure of Lattice-Modulated Thin Films,
Ultramicroscopy
, 14 345–350 (1984).

(13)    J. M. Gibson, R. Hull, J. C. Bean and M. M. J. Treacy,
Elastic Relaxation in Transmission Electron Microscopy of Strained Layer Superlattices,
Appl. Phys. Letts.
, 46 649–651 (1985).

(14)    M. M. J. Treacy, J. M. Gibson and A. Howie,
On Elastic Relaxation and Long Wavelength Microstructures in Spinodally-decomposed InGaAsP Epitaxial Layers,
Philos. Mag.
, A51 389–417 (1985).

(15)    M. M. J. Treacy, J. M. Newsam, R. A. Beyerlein, M. E. Leonowicz and D. E. W. Vaughan,
The Structure of Zeolite CSZ-1 Interpreted as a Rhombohedrally-Distorted Variant of the Faujasite Framework,
J. Chem. Soc. Chem. Commun.
1211–1214 (1986).

(16)    M. M. J. Treacy and J. M. Gibson,
The Effects of Elastic Relaxation on TEM Studies of Thinned Composition- Modulated Materials,
J. Vac. Sci.
B4 1458–1466 (1986).

(17)    M. M. J. Treacy and J. M. Newsam,
Electron Beam Sensitivity of Zeolite L,
Ultramicroscopy
, 23 411–420 (1987).

(18)    M. M. J. Treacy, R. C. Haushalter and S. B. Rice,
Transmission Electron Microscopy Study of the Reaction of Sn
94- Zintl Ions with Single Crystal Au Films,
Ultramicroscopy
, 23 135–150 (1987).

(19)    M. M. Disko, M. M. J. Treacy, S. B. Rice, R. R. Chianelli, J. A. Gland, T. R. Halbert and A. F. Ruppert,
Spatially Resolved Electron Energy Loss Spectroscopy of MoS2 Platelets,
Ultramicroscopy
, 23 313–320 (1987).

(20)    M. M. J. Treacy, R. C. Haushalter and S. B. Rice,
Reaction of Sn
94-  with Single Crystal Au: Textured Fiber Epitaxial growth of AuSn at Room Temperature,
Angew. Chemie.
26 1155–1156 (1987).

(21)    M. M. J. Treacy, J. M. Gibson, K. T. Short and S. B. Rice,
Channeling Effects From Impurity Atoms in the High Angle Annular Detector of the STEM,
Ultramicroscopy
, 26 133–142 (1988).

(22)    M. M. J. Treacy and J. M. Newsam,
Two New Three–Dimensional Twelve–Ring Zeolite Frameworks of which Zeolite Beta is a Disordered Intergrowth,
Nature
, 332 249–251 (1988).

(23)    M. M. J. Treacy and S. B. Rice,
Catalyst Particle Sizes from Rutherford Scattered Intensities,
J. Microsc.
, 156 211–234 (1989).

(24)    J. M. Newsam, M. M. J. Treacy, W. Koetsier and C. B. deGruyter,
Structural Characterization of Zeolite Beta,
Proc. R. Soc. Lond.
, A420 374–405 (1988).

(25)    J. M. Newsam, M. M. J. Treacy, D. E. W. Vaughan, K. G. Strohmaier and W. J. Mortier,
The Structure of Zeolite ZSM–20; Mixed Cubic and Hexagonal Stackings of Faujasite Sheets,
J. Chem Soc. Chem. Commun.
, 493–495 (1989).

(26)    D. E. W. Vaughan, M. M. J. Treacy, J. M. Newsam, K. G. Strohmaier and W. J. Mortier,
Synthesis and Characterization of Zeolite ZSM–20,
in Zeolite Synthesis
ed. by M. L. Occelli and H. E. Robson, ACS Symposium Series No. 398 544–559 (1989).

(27)    M. M. J. Treacy, S. B. Rice, A. J. Jacobson and J. T. Lewandowski,
An Electron Microscopy Study of Delamination in Dispersions of the Perovskite-Related Layered Phases K[Ca
2Nan-3NbnO3n-1]: Evidence for Single Layer Formation,
Chemistry of Materials
, 2 279–286 (1990).

(28)    C. B. de Gruyter, J. P. Verduijn, J. Y. Koo, S. B. Rice and M. M. J. Treacy,
A Transmission Electron Microscopy Study of Grain Boundaries in Zeolite L,
Ultramicroscopy
, 34 102–107 (1990).

(29)    S. B. Rice, J. Y. Koo, M. M. Disko and M. M. J. Treacy,
On the Imaging of Pt Particles in Zeolite Frameworks,
Ultramicroscopy
, 34 108–118 (1990).

(30)    M. M. J. Treacy, J. M. Newsam and M. W. Deem,
A General Recursion Method for Calculating Diffracted Intensities from Crystals Containing Planar Faults,
Proc. R. Soc Lond.
A433 499–520 (1991).

(31)    J. M. Newsam and M. M. J. Treacy,
ZeoFile: A Stack of Zeolite Structure Types,
Zeolites
, 13 183–186 (1993).

(32)    M. M. J. Treacy and J. M. Gibson,
Coherence and Multiple Scattering in ‘Z Contrast’ Images,
Ultramicroscopy
52 31–53 (1993).

(33)    M. M. J. Treacy, J. M. Newsam and M. W. Deem,
Simulation of Electron Diffraction Patterns from Partially Ordered layer Lattices,
Ultramicroscopy
, 52 512–522 (1993).

(34)    S. B. Rice, M. M. J. Treacy and J. M. Newsam,
Shear Faults in Lovelock Ferrierite: An X-Ray and Electron Diffraction Analysis,
Zeolites
, 14 335–343 (1993).

(35)    B. McVicker, J. L. Kao, J. J. Ziemiak, W. E. Gates, J. L. Robbins, M. M. J. Treacy, S. B. Rice, T. H. Vanderspurt, V. R. Cross and A. K. Ghosh,
Effect of Sulfur on the Performance and on the Particle Size and Location of Platinum in Pt/KL Hexane Aromatization Catalysts,
J. Catal.
139 48–61 (1993).

(36)    M. M. J. Treacy, M. E. Bisher and A. J. Jacobson,
A Hollow-Cone Dark-Field Study of Interlayer Cracks in Delaminated H[Ca
2Nan-3NbnO3n-1] Materials,
Philos. Mag.
, 72 161–177 (1995).

(37)    M. M. J. Treacy and J. M. Gibson,
Atomic Contrast Transfer in Annular Dark-Field Images,
J. Microsc.
180 2–11 (1995).

(38)    K. Fossheim, E. Tuset, T. W. Ebbesen, M. M. J. Treacy and J. Schwartz,
Enhanced Flux Pinning in Bi2Sr2CaCu2O8+x Superconductors with Embedded Carbon Nanotubes,
Physica C
, 248 195–202 (1995).

(39)    M. M. J. Treacy, D. E. W. Vaughan, K. G. Strohmaier and J. M. Newsam,
Intergrowth Segregation in fau–emt Zeolite Materials,
Proc. R. Soc. Lond.
452 813–840 (1996).

(40)    T. W. Ebbesen, H. Hiura, M. Bisher, M. M. J. Treacy, J. Shreeve-Keyer and R. Haushalter,
Decoration of Carbon Nanotubes,
Adv. Materials
, 8 155–157 (1996).

(41)    M. M. J. Treacy and J. M. Gibson,
Variable Coherence Microscopy: A Rich Source of Structural Information from Disordered Materials,
Acta Cryst.
A52 212–220 (1996).

(42)    M. M. J. Treacy, T. W. Ebbesen and J. M. Gibson,
Exceptionally high Young’s modulus observed for individual carbon nanotubes,
Nature
, 381 678–680 (1996).

(43)    Singhal, J. M. Gibson, M. M. J. Treacy, P. D. Lane and J. R. Shapley,
Stability of Supported Organometallic Clusters Probed by a Mass-Sensitive TEM Technique,
J. Phys. Chem.
, 100 6385–6388 (1996).

(44)    M. M. J. Treacy, K. H Randall, S. Rao, J. A. Perry and D. J. Chadi,
Enumeration of Periodic Tetrahedral Frameworks,
Z. Krist.
, 212 768–791 (1997).

(45)    J. M. Gibson and M. M. J. Treacy,
Diminished Medium-Range Order Observed in Annealed Amorphous Germanium,
Phys. Rev. Letts
. 78 1074–1077 (1997).

(46)    A. Krishnan, E. Dujardin, M. M. J. Treacy, J. Hugdahl, S. Lynum and T. W. Ebbesen,
Graphitic Cones and the Nucleation of Curved carbon Surfaces,
Nature
, 388 451–454 (1997).

(47)    D. R. Hines, G. T. Seidler, M. M. J. Treacy and S. A. Solin,
Random Stacking of a Commensurate Guest layer in an Ordered Host: of Ni/Al Layer-Double-Hydroxides,
Solid State Commun.
, 101 835–839 (1997).

(48)    D. Hagrman, J. Zubieta, L. M. Meyer, C. Warren, M. M. J. Treacy and R. C. Haushalter,
A New Polymorph of VO2 Prepared by Soft Chemical Methods,
J. Solid State Chem.
, 138 178–182 (1998).

(49)    J. M. Gibson, M. M. J. Treacy, P. M. Voyles, H-C. Jin and J. R. Abelson,
Structural Disorder Induced in Hydrogenated Amorphous Silicon by Light-Soaking,
 Applied Physics Letters
73 3093–3095 (1998).

(50)    J. M. Gibson and M. M. J. Treacy,
Fluctuation Microscopy: Atomic Order revealed in Seemingly Random Electron Speckle Patterns,
 J. Microsc.
(1998).

(51)    E. Dujardin, A. Krishnan, M.M.J. Treacy and T.W. Ebbesen,
Purification of single-walled nanotubes,
Advanced Materials
, 10 611–613 (1998).

(52)    E. Dujardin, T. W. Ebbesen, A. Krishnan and M. M. J. Treacy,
Wetting of Single Shell Carbon Nanotubes,
Advanced Materials, 10 1472–1475 (1998).

(53)    N. Yao, V. Lordi, and S. X. C. Ma, E. Dujardin, A. Krishnan, M. M. J. Treacy, and T. W. Ebbesen,
Structure and oxidation patterns of carbon nanotubes,
J. Mater. Res.,
13 2432–2437 (1998).

(54)    M. M. J. Treacy, J. M. Gibson and P. J. Keblinski,
Paracrystallites found in evaporated amorphous tetrahedral semiconductors,
J. Non-Cryst. Solids
, 231 99–110 (1998).

(55)    A. Krishnan, E. Dujardin, T. W. Ebbesen, P. N. Yianilos and M. M. J. Treacy
Young’s modulus of single-walled nanotubes,
 Phys. Rev. B
58 14013–14019 (1998).

(56)    M. M. J. Treacy,
Dynamical Diffraction in Metallic Optical Gratings,
Appl. Phys Letts.
75 606–608 (1999).

(57)    M. M. J. Treacy,
Deactivation of Pt/KL Reforming Catalysts by Pt Agglomeration and Entombment,
 J. Microporous and Mesoporous Materials
, 28 271–292 (1999).

(58)    P. M. Voyles, J. M. Gibson  and M. M. J. Treacy,
Fluctuation Microscopy: A Probe of Atomic Correlations in Disordered Materials,
J. Electron Microsc.
49(2) 259–266 (2000).

(59)    M. M. J. Treacy, P. M. Voyles and J. M. Gibson,
Schläfli Cluster Topological Analysis of Medium Range Order in Paracrystalline Amorphous Semiconductor Models,
J. Non-Cryst. Solids
, 266269 150–155 (2000).

(60)    G. Xu, G. Aeppli, M. E. Bisher, C. Broholm, J. F. DiHusa, C. D. Frost, T. Ito, K. Oka, R.L. Paul, H. Takagi and M. M. J. Treacy,
Holes in a quantum spin liquid,
Science
, 289 419–422 (2000).

(61)    M. M. J. Treacy, A. Krishnan and P. Yianilos,
Inferring Physical Parameters from Images of Vibrating Carbon Nanotubes,
Microsc. Microanal.
6 317–323 (2000).

(62)    J. M. Gibson, M. M. J. Treacy and P. M. Voyles,
Atom Pair Persistence in Disordered Materials from Fluctuation Microscopy,
Ultramicroscopy
83 169–178 (2000).

(63)    M. M. J. Treacy,
Book review of “Structures and Structure Determination”, ed by: H. G. Karge and J. Weitkamp,
J. Microporous and Mesoporous Materials
, (2000).

(64)    P. M. Voyles, J. E. Gerbi, M. M. J. Treacy, J. M. Gibson and J. R. Abelson,
Increased medium-range order in amorphous silicon with increased substrate temperature,
Phys. Rev. Lett
, 86 5514–5518 (2001).

(65)    P. M. Voyles, N. Zotov, S. M. Nahkmanson, D. A. Drabold, J. M. Gibson, M. M. J. Treacy and P. Keblinski,
The Structure and Physical Properties of Paracrystalline Atomistic Models of Amorphous Silicon,
J. Applied Physics
, 90 4437–4451  (2001).

(66)    A. Krishnan, M. M. J. Treacy, M. E. Bisher, P. Chandra and P. B. Littlewood,
Efficient Switching and Domain Interlocking Observed in Polyaxial Ferroelectrics
Integrated Ferroelectrics
. (2002).

(67)    M. J. Higgins, A. Krishnan, M. M. J. Treacy and S. Bhattacharya,
Depoling a ferroelectric capacitor,
J. Appl. Phys.
80 1–3 (2002).

(68)    M. M. J. Treacy,
A dynamical diffraction explanation of the anomalous transmission of light through metallic hole arrays,
Phys. Rev. B
66 195105 (2002).

(69)    M. M. J. Treacy,
Describing ordered microporous and mesoporous materials,
J. Microporous and Mesoporous Materials
, 58 1–2 (2003).

(70)    R. K. Dash, P. M. Voyles, J. M. Gibson, M. M. J. Treacy and P. Keblinski,
A quantitative measure of medium-range order in amorphous materials from transmission electron micrographs,
J. Phys.
: Condens. Matter, 15 S2425–2435 (2003).

(71)    Ju-Yin Cheng, M. M. J. Treacy, P. J. Keblinski and J. M. Gibson,
Diffraction microscopy for disordered tetrahedral networks,
J. Appl. Phys.
(2004).

(72)    M. M. J. Treacy, I. Rivin, E. Balkovsky, K. H. Randall and M. D. Foster,
Enumeration of Periodic Tetrahedral Frameworks. II. Polynodal Graphs,
Microporous and Mesoporous Materials
74 121–132. (2004).

(73)    M. D. Foster, M. M. J. Treacy, J. B Higgins, I. Rivin, E. Balkovsky and K. H. Randall,
Crystal Structure Solution by a Systematic Topological Search: The Framework Topology of Zeolite ZSM-10,
submitted to Chemistry of Materials
(2004).

(74)    M. M. J. Treacy, M. D. Foster and K. H. Randall,
An Efficient Method for Determining Zeolite Vertex Symbols,
Accepted by Microporous and Mesoporous Materials
, (2004).

 

Conference Proceedings etc…

(1)        M. M. J. Treacy, A. Howie and S. J. Pennycook
Z Contrast of Supported Catalyst Particles in the STEM
Inst. Phys. Conf. Ser. No
.52 261–265 (1980).

(2)        P. E. Batson and M. M. J. Treacy,
Low Energy-loss Structure of Small Aluminum Particles,
in Proceedings of the 38th Annual Electron Microscopy Society of America meeting
, ed. by G.W. Bailey (Claitor's Publishing Division; Baton Rouge), 126–127 (1980).

(3)        M. M. J. Treacy and J. M. Gibson,
Detection of Interstitial Impurities Using a High Angle Annular Detector in STEM,
in Proceedings of ASU Conference on 'STEM in Solid State Science'
, Castle Hot Springs, Arizona, (ed O. L. Krivanek), 194 (1981); and Ultramicroscopy, 7 p109 (1981).

(4)        M. M. J. Treacy, D. A. Smith, W. Krakow and G. Trafas,
Low-Loss Surface Imaging of Thin Films in STEM,
Inst. Phys. Conf. Ser. No
. 61 429–433 (1981).

(5)        M. M. J. Treacy and J. M. Gibson,
On the Detection of Point Defects in Crystals Using High Angle Diffuse Scattering in the STEM,
Inst. Phys. Conf. Ser. No
. 61 263–267 (1981).

(6)        F. Glas, P. Hénoc, A. Izraël, H. Launois, M. Quillec and M. M. J. Treacy,
STEM Microanalysis of Composition Modulations in InGaAsP Alloys Grown by Liquid Phase Epitaxy,
in Proceedings of the 10th International Congress on Electron Microscopy
, Hamburg 406–406 (1982).

(7)        H. Launois, M. Quillec, F. Glas and M. M. J. Treacy,
Interface Spinodal Decomposition in LPE InGaAsP Lattice-matched to InP,
in Proceedings of the 10th International Conference on Defects in Semiconductors
, The Metallurgical Society of AIME, (1982).

(8)        M. M. J. Treacy, J. M. Gibson and R. Hull,
Elastic Relaxation in Compositionally-Modulated Thin Films,
in Proceedings of the 13th International Conference on Defects in Semiconductors
, The Metallurgical Society of AIME, 1179–1186 (1985).

(9)        J. M. Gibson, M. M. J. Treacy, R. Hull and J. C. Bean,
Transmission Electron Microscopy of Strained Layer Superlattices,
in Layered Structures, Epitaxy and Interfaces
, ed. by J. M. Gibson and L. R. Dawson, Materials Research Society Symp. Proc. Vol. 37 (1985).

(10)      M. M. J. Treacy,
Detection and Imaging of Supported Catalyst Particles,
in Materials Problem solving with the Transmission Electron Microscope
, ed. by L. W. Hobbs, K. H. Westmacott and D. B. Williams, Materials Research Society Symp. Proc. Vol. 62 367–372 (1986).

(11)      M. M. J. Treacy, J. M. Newsam, D. E. W. Vaughan, R. A. Beyerlein and S. B. Rice,
Stress and Rhombohedral Distortion in Platelet Faujasite-type Zeolites,
in Analytical Electron Microscopy – 1987
, ed. by D. C. Joy, San Francisco Press, San Francisco, 161–165 (1987).

(12)      S. B. Rice and M. M. J. Treacy,
The Art of the Possible: An Overview of Catalyst Specimen Preparation Techniques for TEM Studies,
in Specimen Preparation for Transmission Electron Microscopy of Materials
, ed. by J. C. Bravman, R. M. Anderson and M. L. McDonald, Materials Research Society Symp. Proc. Vol. 115 15–27 (1988).

(13)      M. M. J. Treacy, J. M. Newsam, D. E. W. Vaughan, R. Beyerlein, S. B. Rice and C. B. de Gruyter,
On the propagation of twin–fault–induced stress in platelet FAU framework zeolites,
in Microstructure and Properties of Catalysts
, ed by M. M. J. Treacy, J. M. Thomas and J. M. White, Materials Research Society Symp. Proc. Vol. 111 177–190 (1988).

(14)      S. B. Rice and M. M. J. Treacy,
Measurement of Particle Sizes in the STEM Using High–Angle Annular Detector Image Intensities,
in Proc. 46th Meeting of the Electron Microscopy Society of America
, San Francisco Press, San Francisco, 696–697 (1988).

(15)      J. H. Butler and M. M. J. Treacy,
High Spatial–Resolution Microanalysis in the Petrochemical Industry,
in Microbeam Analysis – 1988, ed. by D. E. Newbury, San Francisco Press, San Francisco, 69–74 (1988).

(16)      M. M. J. Treacy,
Elastic Relaxation and TEM Image Contrasts in Thin Composition–Modulated Semiconductor Crystals,
in Evaluation of Advanced Semiconductor Materials by Electron Microscopy
, ed. by D. Cherns, NATO ASI series B203 255–266 (1989).

(17)      M. M. J. Treacy, J. M. Newsam and M. W. Deem,
Diffraction From Zeolites Containing Planar Faults,
in Characterization of Structure and Chemistry of defects in Materials
, ed. by B. C. Larson, M. Ruhle and D. N. Seidman, Materials Research Society Symposium Proceedings Vol 138 497–502 (1989).

(18)      D. E. W. Vaughan, M. M. J. Treacy and J. M. Newsam,
Recent Advances in Techniques for Characterizing Zeolite Structures,
in Guidelines for Mastering the Properties of Molecular Sieves
, Ed. by D. Barthomeuf et al. Plenum Press, New York 99–120 (1990).

(19)      S. B. Rice and M. M. J. Treacy,
Imaging Single Platinum Atoms on Zeolites in the STEM,
in XIIth International Congress for Electron Microscopy
, Ed. by G. W. Bailey, San Francisco Press, San Francisco 240–241 (1990).

(20)      J. M. Newsam, M. M. J. Treacy, D. E. W. Vaughan, K. G. Strohmaier and M. T. Melchior,
Intergrowths in Zeolite Structures,
in Synthesis of Microporous Materials - Molecular Sieves
, Vol 1, ed by M. L. Occelli and H. E. Robson, Van Nostrand Reinhold, New York, 454–472 (1992).

(21)      M. M. J. Treacy, M. E. Bisher and A. J. Jacobson,
Hollow-Cone Analysis of Intercalated Particles in Layered H[Ca
2Nan-3NbnO3n-1] Materials,
in Proc. 51st Annual Electron Microscopy Society of America Meeting
, Ed. by G. W. Bailey and C. L. Rieder, San Francisco Press, San Francisco 748–749 (1993).

(22)      M. M. J. Treacy, S. Rao and I. Rivin,
A Combinatorial Method for Generating New Zeolite Frameworks,
in Proceedings of the 9th International Zeolite Conference, Montreal 1992
, Eds R. Von Ballmoos, J. B. Higgins and M. M. J. Treacy, Butterworth-Heinemann (Stoneham, Massachusetts) 381–388 (1993).

(23)      D. E. W. Vaughan, K. G. Strohmaier, M. M. J. Treacy, S. B. Rice and M. E. Leonowicz,
The influence of Intergrowths on Zeolite Properties,
in Natural Zeolites ‘93
, Ed. by D. W. King and F. H. Mumpton, Int. Comm. Natural Zeolites, Brockport, New York, 187–198 (1994).

(24)      A. Singhal, J. M. Gibson and M. M. J. Treacy,
Mass Measurement in Sub-Nanometer Clusters by Z-Contrast Microscopy,
Microbeam Analysis Society, Proceedings 29th Annual Conference
Breckenridge, Colorado, ed. by E. S. Etz, (VCH: New York) 277–278 (1995).

(25)      M. M. J. Treacy, M. E. Bisher, A. J. Jacobson and J. M. Gibson,
In Z-contrast, Not All That Glistens is High-Z,
in Proc. Microscopy and Microanalysis 1995
, ed. by G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec, Jones & Begall Publishing, New York, 174–175 (1995).

(26)      M. E. Bisher, D. K. Fygenson, F. Booy, A. Libchaber and M. M. J. Treacy,
Cryo-Electron and Optical Microscopy Study of Lipid-Encapsulated Microtubules,
in Proc. Microscopy and Microanalysis 1995
, ed. by G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec, Jones & Begall Publishing, New York, 712–713 (1995).

(27)      S. A. Solin, D. R. Hines, G. T. Seidler and M. M. J. Treacy,
Novel Structural Properties of Ni
1-xAlx Layer Double Hydroxides,
Proceedings of the ISICS conference
, J. Phys. Chem. Solids 57 1043–1048 (1996).

(28)      A. Krishnan, E. Dujardin, M. E. Bisher, M. M. J. Treacy, J. Hugdahl, S. Lynum and T. W. Ebbesen,
Graphitic Cones,
in Proc. Microscopy and Microanalysis 1997
, ed. by G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy & T. P. Pretlow, Springer-Verlag New York Inc., 437–438 (1997).

(29)      M. M. J. Treacy and T. W. Ebbesen,
Mechanical Properties of Carbon Nanotubes Inferred from TEM,
in Proc. Microscopy and Microanalysis 1997
, ed. by G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy & T. P. Pretlow, Springer-Verlag New York Inc., 393–394 (1997).

(30)      M. M. J. Treacy and J. M. Gibson,
Statistics of Partially Coherent Dark-Field Images of Amorphous Materials,
in Electron Microscopy and Analysis 1997
, ed. by J. M. Rodenburg, Inst. Phys. Conf. Ser. No. 153, (Institute of Physics, London) 433–436 (1987).

(31)      J. M. Gibson, M. M. J. Treacy and D. Loretto,
Electron Speckle and Higher-Order Correlation Functions from Amorphous Thin Films,
in Structure and Dynamics of Glasses and Glass Formers
, ed. by C. A. Angell, K. L. Ngai, J. Kieffer, T. Egami, and G. U. Nienhaus, Materials Research Society Symposium Proceedings Vol 455 349–356 (1998).

(32)      J. M. Gibson, M. M. J. Treacy and P. M. Voyles,
Fluctuation Microscopy: A new class of microscopy techniques for probing medium range order in amorphous materials,
Microsc. Microanal.
4 (Suppl 2: Proceedings) (Microscopy Society of America, Springer) 702–703 (1998).

(33)      A.Krishnan, E. Dujardin, T.W.Ebbesen and M.M.J.Treacy
Graphitic Disks or Polygons? Faceting of graphite disks,
Microsc. Microanal.
4 (Suppl 2: Proceedings) (Microscopy Society of America, Springer) 708–709 (1998).

(34)      M. M. J. Treacy, K. H. Randall and S. Rao,
The search for new zeolite frameworks,
in Proceedings of the twelfth International Zeolite Conference
, ed. by M. M. J. Treacy, B. K. Marcus, M. E. Bisher and J. B. Higgins, (Materials Research Society, Warrendale, USA) Vol. 1 pp 517–532, (1999).

(35)      H. Gies, R. Kirchner, H. van Koningsveld and M. M. J. Treacy,
Faulted zeolite framework structures,
in Proceedings of the twelfth International Zeolite Conference
, ed. by M. M. J. Treacy, B. K. Marcus, M. E. Bisher and J. B. Higgins, (Materials Research Society, Warrendale, USA) Vol. 4 pp 2099–3099, (1999).

(36)      J. M. Gibson, M. M. J. Treacy, P. M. Voyles, J. R. Abelson and H-C. Jin,
Changes in the Medium Range Order of a-Si:H Thin Films Observed by Variable Coherence TEM,
in Amorphous and Microcrystalline Silicon Technology—1998
, ed. by S. Wagner, M. Hack, H. M. Branz, R. Schropp, and I. Shimizu, Materials Research Society Symposium Proceedings Vol 507 837–842 (1998).

(37)      J. M. Gibson, J-Y. Cheng, P. M. Voyles, M. M. J. Treacy, and D. C. Jacobson,
The Structure of Ion-Implanted Amorphous Silicon,
In Microstructural Processes in Infrared Materials
ed. by S. J. Zinkle, G. Lucas, R. Ewing and J. Williams, Materials Research Society Symposium Proceedings Vol 540 27–30 (1999).

(38)      A. Krishnan, M. E. Bisher and M. M. J. Treacy,
In situ Observation of Ferroelectric Domain Motion in BaTiO3,
Microsc. Microanal.
5 (Suppl 2: Proceedings) (Microscopy Society of America, Springer) 780–781 (1999).

(39)      J-Y. Cheng, J. M. Gibson, P. M. Voyles, M. M. J. Treacy, D. C. Jacobson,
Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM,
in Advances in Materials Problem Solving with the Electron Microscope ed. By J. Bentley, U. Dahmen, C. Allen, I. Petrov
Mater. Res. Soc. Symp. Proc. 589
, 247 (1999).

(40)      M. M. J. Treacy, A. Krishnan, E. Dujardin, P. N. Yianilos and T. W. Ebbesen,
“Y” Contrast of Single Shell Carbon Nanotubes: determination of Young’s Modulus by Observing Thermal Vibrations,
Microsc. Microanal.
5 (Suppl 2: Proceedings) (Microscopy Society of America, Springer) 676–677 (1999).

(41)      P. M. Voyles, M. M. J. Treacy, J. M. Gibson, H. C. Jin and J. R. Abelson,
Experimental Methods and Data Analysis for Fluctuation Microscopy,
in Amorphous and Heterogeneous Silicon Thin Films 2000
, ed. by R. W. Collins, H. M. Branz, S. Guha, H. Okamoto, M. Stutzmann, Materials Research Society Symposium Proceedings Vol 609 xxx–yyy (2001).

(42)      P. M. Voyles, J. E. Gerbi, M. M. J. Treacy, J. M. Gibson, J. R. Abelson,
Increased Medium-Range Order in Amorphous Silicon with Increased Substrate Temperature
J. Non-Cryst. Solids, 293295, 45–52 (2001).

(43)      M. M. J. Treacy, P. M. Voyles and J. M. Gibson,
Topological Signatures of Medium Range Order in Amorphous Semiconductor Models,
in Amorphous and Heterogeneous Silicon Thin Films 2000
, ed. by R. W. Collins, H. M. Branz, S. Guha, H. Okamoto, M. Stutzmann, Materials Research Society Symposium Proceedings Vol 609 A2.5.1–A2.5.6 (2001).

(44)      P. M. Voyles, M. M. J. Treacy, H. C. Jin, J. R. Abelson, J. M. Gibson, S. Guha and R. S. Crandall,
Comparative Fluctuation Microscopy Study of Medium-Range Order in Hydrogenated Amorphous Silicon Deposited by Various Methods,
in Amorphous and Heterogeneous Silicon Thin Films 2000
, ed. by R. W. Collins, H. M. Branz, S. Guha, H. Okamoto, M. Stutzmann, Materials Research Society Symposium Proceedings Vol 609 A2.4.1–A2.4.6 (2001).

(45)      A. Krishnan, M. M. J. Treacy, M. E. Bisher, P. Chandra and P. B. Littlewood,
Displacement Charge Patterns and Ferroelectric Domain Wall Dynamics Studied by In-Situ TEM,
in Ferroelectric Thin Films VIII
, ed. by R. W. Schwartz, P. C. McIntyre, Y. Miyasaka. S. R. Summerfelt and D. Wouters, Materials Research Society Symposium Proceedings Vol 596 161–166 (2000).

(46)      A. Krishnan, M. M. J. Treacy, M. E. Bisher, P. Chandra and P. B. Littlewood,
Maxwellian Charge on Domain Walls,
in Fundamental Physics of Ferroelectrics 2000: Aspen Center for Physics Winter Workshop
, ed. by R. E. Cohen, American Institute of Physics Conference Proceedings 535 191–200 (2000).

(47)      M. M. J. Treacy,
Deactivation of Pt/Zeolite-L Catalysts Studied by Z-Contrast,
Microsc. Microanal.
6 (Suppl 2: Proceedings) (Microscopy Society of America, Springer) xxx–xxx (2000).

(48)      A. Krishnan, M. M. J. Treacy, M. E. Bisher, P. Chandra and P. B. Littlewood,
Maxwellian Charge on Ferroelectric Domain Walls in KNbO3,
Microsc. Microanal.
6 (Suppl 2: Proceedings) (Microscopy Society of America, Springer) xxx–xxx (2000).

(49)      P. M. Voyles, M. M. J. Treacy and J. M. Gibson.
Thermodynamics of Paracrystalline Silicon,
in New Methods, Mechanisms and Models of Vapor Deposition, ed. By H. N. G. Wadley, G. Gilmer, and W. Barker, Materials Research Society, Warrendale PA,
Mat. Res. Soc. Symp. Proc.
Vol 616 47–52 (2001).

(50)      M. M. J. Treacy and J. Kilian,
Designability of Graphitic Cones.
Mat. Res. Soc. Symp. Proc. Vol
675 (2001).

(51)      M. M. J. Treacy and J. M. Gibson,
Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials
submitted to SPIE
(International Society for Optical Engineering) Conf proceedings (2003).

(52)      J-Y. Cheng, M. M. J. Treacy and P. J. Keblinski,
Metamict Transformation of Silica,
MRS Symposium Proceedings Series, Vol. 762, A5.18.1-6 (MRS, Warrendale, PA 2003).

(53)      L. Fang, I. McNulty, D. Paterson, M. M. J. Treacy and J. M. Gibson
Fluctuation X-ray Microscopy for Measuring Medium-Range Order,
Mater. Res. Soc. Symp. Proc. Vol.840, Q6.7.1-Q.6.7.6 (2005).

(54)      L. Fang, I. McNulty, D. Paterson, M. M. J. Treacy and J. M. Gibson
Fluctuation microscopy – a tool for examining medium-range order in non-crystalline systems,
accepted by Nuclear. Inst. Method. B
(2005).

(55)      M. M. J. Treacy
Fluctuation Microscopy for the MASses, Proceedings of the Microbeam Analysis Society (2005)

 

Proceedings and Books

(1)     M. M. J. Treacy, J. M. Thomas and J. M. White,
Microstructure and Properties of Catalysts
Materials Research Society Symp. Proc. Vol 111
(1988).

(2)     R. Von Ballmoos, J. B. Higgins and M. M. J. Treacy,
Proceedings of the Ninth International Zeolite Conference,
Butterworth-Heinemann, Stoneham Massachusetts (1993).

(3)        M. M. J. Treacy, J. B. Higgins R. von Ballmoos,
Collection of Simulated XRD Powder Patterns For Zeolites,
Third Edition, Elsevier (1996).

(4)        M. M. J. Treacy, B. K. Marcus, M. E. Bisher and J. B. Higgins,
Proceedings of the twelfth International Zeolite Conference
Materials Research Society, Warrendale, USA (1998)

(5)        M. M. J. Treacy and J. B. Higgins
Collection of Simulated XRD Powder Patterns For Zeolites,
Fourth Edition, Elsevier, (2001).

 

 

Invited Lectures

National/International Conferences

(1)        “Z Contrast of Supported Catalyst Particles in the STEM”, Institute of Physics Conference, Electron Microscopy and Microanalysis Group, Brighton (9/1979)

(2)        “Le Microscope Eléctronique à Balayage et en Transmission, ou STEM”, lecture presented in French at the Bombannes Summer School, Bordeaux (8/1981).

(3)        “Optimizing Atomic Number Contrast in Annular Dark Field Images of Thin Films in the Scanning Transmission Electron Microscope” presented in French at TEM conference, Reims (1982).

(4)        “Atomic Number Imaging of Supported Catalyst Particles Using the Scanning Transmission Electron Microscope”, American Chemical Society Conference on Catalytic Materials: Relationship Between Structure and Activity, San Francisco (1983).

(5)        “Transmission electron Microscopy of Surfaces and particles”, Solid State Physics Gordon Conference, Plymouth NH (6/1985).

(6)        “Detection and Imaging of Supported Catalyst Particles”, in Materials Problem solving with the Transmission Electron Microscope, Annual Materials Research Society Fall Symposium, Boston (12/1986).

(7)        “Stress and Rhombohedral Distortion in Platelet Faujasite-type Zeolites”, Annual Microbeam Analysis Society Conference, Hawaii (1987).

(8)        “The Art of the Possible: An Overview of Catalyst Specimen Preparation Techniques for TEM Studies”, in Specimen Preparation for Transmission Electron Microscopy of Materials, Annual Materials Research Society symposium (12/1988).

(9)        “Measurement of Particle Sizes in the STEM Using High–Angle Annular Detector Image Intensities”, Annual Microscopy Society of America Conference, (8/1988).

(10)      “High Spatial–Resolution Microanalysis in the Petrochemical Industry”, Annual Microscopy Society of America meeting, Albuquerque NM (8/1988).

(11)      “Characterization of faulted zeolites”, Solid State Chemistry Gordon Conference, (1988).

(12)      “Elastic Relaxation and TEM Image Contrasts in Thin Composition–Modulated Semiconductor Crystals”, in Evaluation of Advanced Semiconductor Materials by Electron Microscopy, NATO conference (10/1988).

(13)      “Structure-Property relationships in Catalysts”, Annual American Society of Metallurgists conference, Cleveland (10/1991).

(14)      “Intergrowths in Zeolite Structures”, American Chemical Society Symposium on Molecular Sieves, New York (1992).

(15)      “The influence of Intergrowths on Zeolite Properties”, conference on “Natural Zeolites, (1993).

(16)      “A recursion method for simulating diffraction from faulted crystals'', American Crystallographic Association, Albuquerque (8/1993).

(17)      “Z-contrast: the real and the imagery”, Frontiers of Electron Microscopy, Berkeley (6/1994).

(18)      “In Z-contrast, Not All That Glistens is High-Z”, Annual Microscopy Society of America Conference (8/1995).

(19)      “Combinatorial Methods for Generating Zeolite Frameworks” Zeolites and Layered Materials Gordon Conference (6/1995).

(20)      “Dark Field Speckle: Is It More Than Just Spots Before The Eyes?'', Frontiers of Electron Microscopy, Chicago, (6/1996).

(21)      “A combinatorial method for generating new zeolite frameworks'', International Union for Crystallography Conference, Seattle, (8/1996).

(22)      “Disorder in crystals and order in amorphous materials: a TEM and diffraction study”, American Crystallographic Association, St. Louis (7/1997).

(23)      “Mechanical Properties of Carbon Nanotubes Inferred from TEM”, Annual Microscopy Society of America Conference (8/1997).

(24)      “Zeolite families and their faulty relatives”, DOE workshop on Partially disordered chemical systems, Santa Fe, NM (5/1998).

(25)      “Young’s Modulus of Carbon Nanotubes by TEM”, National Center for Electron Microscopy colloquium, Berkeley (6/1998).

(26)      “The search for new zeolite frameworks”, Plenary Lecture 12th International Zeolite Conference (7/1998).

(27)      “Y Contrast of Single Shell Carbon Nanotubes: determination of Young’s Modulus by Observing Thermal Vibrations”, Annual Microscopy Society of America Conference, Portland, OR (08/1999).

(28)      “Deactivation of Pt/Zeolite-L Catalysts Studied by Z-Contrast” Annual Microscopy Society of America Conference, Philadelphia, PA (08/2000).

(29)      “Designability of carbon cones”, Annual Materials Research Society Spring meeting, (4/2001).

(30)      “Enumeration of Zeolite Frameworks”, Mansfield College Meeting, SSG on Solid State Chemistry, Oxford, UK (4/2003).

(31)      “Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials”, SPIE (International Society for Optical Engineering) Conference, Santa Fe, NM (6/2003).

(32)      “Finding the Meaningful Spatial Patterns in Structural Noise”, Keynote talk at the first Symposium on Fluctuation Electron Microscopy and Nanoscale Ordering in Amorphous Materials” at U. Illinois, Urbana-Champaign (6/2003).

(33)      “Enumeration of Hypothetical Zeolite Frameworks”, Keynote speaker at the North East Corridor Zeolite Association (NECZA) meeting (12/2003).

 

Seminars and Colloquia

(1)        “Hollow cone studies of Pt and Pd catalysts”, Metal Physics Seminar, Cavendish Laboratory., (7/1977).

(2)        “Z-contrast of Pt and Pd catalysts”, Metal Physics Seminar, Cavendish Laboratory., (7/1978).

(3)        “Z contrast imaging in the STEM”, Metal Physics Seminar, Cavendish Laboratory., (7/1979).

(4)        “Z contrast imaging in the STEM”, Seminar at IBM T. J. Watson Research Labs., (7/1979).

(5)        “Imaging With Rutherford Scattered Electrons in the STEM”, Seminar at AT&T Bell Labs. (12/1980).

(6)        “Z contrast imaging in the STEM”, Seminar at Cornell University (12/1980).

(7)        “TEM of supported Catalysts”, Exxon, Linden, NJ (3/1981).

(8)        “Z contrast”, Institut Français du Pétrole, Paris (2/1982).

(9)        “Spinodal decomposition in InGaAsP quaternary semiconductors”, Karlsruhe, (10/1981).

(10)      “Scanning Transmission Electron Microscopy of Catalysts”, Exxon, Linden, NJ (4/1982).

(11)      “Z contrast in the Scanning Transmission Electron Microscope”, U. Arizona (4/1982).

(12)      “The Macintosh in an Electron Microscope Lab.”, Round Valley Computer Symposium NJ (5/1986).

(13)      “The Effects of Elastic Relaxation on TEM Studies of Thinned Composition-Modulated Materials”, Exxon Semiconductor Conference, (1986).

(14)      “Transmission electron microscopy of zeolite catalysts”, Presentation to President of Exxon Research & Engineering Co., Clinton, NJ (5/1988).

(15)      “Characterization of faulting in zeolites”, Seminar at North Western University (5/1989).

(16)      “Deactivation mechanisms of the EXAR catalyst”, Presentation to President of Exxon Research & Engineering Co. (7/1989).

(17)      “Characterization of faulting in zeolites”, Seminar at Penn. State (1/1990).

(18)      “Imaging with Rutherford scattered electrons”, Seminar at Internal Exxon Conference, Clinton (4/1990).

(19)      “Z contrast imagining of supported catalysts”, Seminar at NEC Princeton (4/1990).

(20)      “Electron Microscopy of Inorganic Solids”, Lecture at Princeton Chemistry Department (1990).

(21)      “Characterization of defects in Zeolites”, Barrer Award Plenary Lecture, British Zeolite Association meeting, Durham (3/1991).

(22)      “Imaging with Rutherford Scattered Electrons in the TEM”, NEC Tsukuba, Japan (10/1991).

(23)      “DIFFaX: A Fortran Program for Computing Diffraction From faulted Crystals”, BioSym Workshop on Molecular Modeling and Simulation, San Diego (10/1991).

(24)      “Imaging Complex Materials Using Rutherford Scattered Electrons in the TEM”, Princeton Electrical Engineering Department, (1/1992).

(25)      “Atomic Number Imaging in the Transmission Electron microscope”, Workshop on Imaging of Complex Materials, Princeton Materials Institute, (5/1992).

(26)      “Combinations, graphs and zeolite frameworks”, NECI Internal colloquium, (11/1993).

(27)      “From Graphs and Gaping Holes to Gasoline: A combinatorial Method for Generating New Zeolite Frameworks”, Colloquium, U. Illinois, (11/1995)

(28)      “The Basics of Crystallographic Symmetry”, lecture to graduate students at U. Illinois (11/1995).

(29)      “Variable Coherence Microscopy: A Rich Source of Structural Information from Disordered Materials”, Cornell (11/1995)

(30)      “A Combinatorial Method for generating new zeolites”, U. Ohio, Chemistry Department, (1/1996).

(31)      “A combinatorial method for generating new zeolite frameworks”, NECI (2/1996).

(32)      “From graphs and gaping holes to gasoline: a combinatorial method for finding new zeolite frameworks”, U. Maryland, Chemistry Department, (6/1996).

(33)      “A combinatorial method for generating new zeolite frameworks'', Stevens Institute of Technology (4/1996).

(34)       “The search for new zeolite frameworks”, Chemistry department, Lehigh University (9/1998).

(35)      “Young’s Modulus of Carbon Nanotubes by TEM”, NECI colloquium (01/1999).

(36)      “Anomalous Transmission in Thin Metallic Hole Arrays: A Diffraction Explanation”, Colloquium, NECI. (11/1999).

(37)      “Domain dynamics in Ferroelectrics”, NEC Exhibit Miyazaki, Japan (07/1999).

(38)      “Domain dynamics in Ferroelectrics”, NEC Ultra-LSI Research Laboratory, Japan (07/1999).

(39)      “Displacement Charge Patterns and Domain Interlocking in Polyaxial Ferroelectrics”, Argonne National Labs., Illinois (10/2000).

(40)      “Young’s Modulus of Carbon Nanotubes by TEM”, Colloquium, U. Illinois, Urbana-Champaign (6/2000).

(41)      “Displacement Charge Patterns and Domain Interlocking in Polyaxial Ferroelectrics”, NECI Journal Club Talk (11/2000).

(42)      “Displacement Charge Patterns and Domain Interlocking in Polyaxial Ferroelectrics”, Rennselaer Polytechnic (11/2000).

(43)      “Speckly silicon, twitching nanotubes and transparent mirrors: a trio of interesting scattering experiments” Engineering and Physics Dept. U. San Diego (5/2000).

(44)      “Young’s Modulus of Carbon Nanotubes by TEM”, Colloquium, Los Alamos National Labs. (5/2000).

(45)      “Anomalous Transmission in Thin Metallic Hole Arrays: Diffraction vs. Surface Plasmons”, Colloquium, Los Alamos National Labs. (5/2000).

(46)      “Determining the Young’s Modulus of Carbon Nanotubes by watching them twitch”, Colloquium, U. Illinois, Urbana-Champaign, (10/2000).

(47)      “Study of ferroelectric switching by in-situ TEM”, colloquium, Argonne National Labs, Chicago IL, (11/2000)

(48)      “Study of ferroelectric switching by in-situ TEM”, colloquium, Rennsaeler Polytechnic, Troy NY, (11/2000)

(49)      “Young’s Modulus of Carbon Nanotubes by TEM”, Colloquium, U. Davis, (10/2001).

(50)      “Designability of carbon cones”, NECI seminar, (6/2001).

(51)      “In-situ optical microscopy of switching in ferroelectrics”, NECI seminar, (11/2001).

(52)      “Anomalous transmission in thin metallic hole arrays is a diffraction phenomenon, and is not caused by surface plasmons”, NECI seminar, (3/2002).

(53)      “Determining the Young’s modulus of carbon nanotubes in the TEM”, seminar at University College London, (9/2002).

(54)      “Determining the Young’s modulus of carbon nanotubes in the TEM”, seminar at Washington University St. Louis, (9/2002).

(55)      “Good fences make good neighbours. A TEM study of domain switching in ferroelectrics”, seminar at University College London, (11/2002).

(56)      “Determining the Young’s modulus of carbon nanotubes in the TEM”, seminar at Purdue University, W. Lafayette Indiana, (1/2003).

(57)      “Do Surface Plasmons Really ‘Cause’ Anomalous Transmissions in Metal Hole Arrays?”, seminar at Argonne National Laboratories, (1/2003).

(58)      “Determining the Young’s modulus of carbon nanotubes in the TEM”, seminar at Argonne National Laboratories, (1/2003).

(59)      “Determining the Young’s modulus of carbon nanotubes in the TEM”, seminar at Johns Hopkins University (2/2003).

(60)      “Determining the Young’s modulus of carbon nanotubes in the TEM”, seminar at Arizona State University, (2/2003).

(61)      “Enumeration of Zeolite Frameworks” seminar at Solid State Group Conference, Mansfield College, Oxford, April 7th 2003, (4/2003).

(62)      “Enumeration of Zeolite Frameworks” seminar at Arizona State University Chemistry Department, (5/2003).

(63)      “Do Surface Plasmons Really ‘Cause’ Anomalous Transmissions in Metal Hole Arrays?”, seminar at Arizona State University Physics Department, (5/2003).

(64)      “Enumeration of Zeolite Frameworks” seminar at ExxonMobil, Clinton New Jersey, (4/2003).

(65)      “Fluctuation Microscopy: A technique for revealing atomic correlations” invited talk at the SPIE “Fluctuations and Noise” conference in Santa Fe, (6/2003).

(66)      Finding the meaningful spatial patterns in structural noise” keynote speaker at the first Fluctuation Microscopy Conference, Urbana-Champaign, Illinois (7/2003).

(67)      “Enumeration of Hypothetical Zeolites”, Keynote talk at the North East Corridor Zeolite Association Annual Meeting, (12/2003).

(68)      “Fluctuation Microscopy: A New Technique for Detecting Order in Structurally Disordered Materials”, Graduate Colloquium, ASU Physics & Astronomy, (2/2004).

(69)      “Detecting the Meaningful Spatial Patterns in Structurally Noisy Materials by Fluctuation Microscopy”, Arizona Imaging and Analysis Society, ASU, Tempe (3/2004).

(70)      A sharper view of Randomness? What aberration-corrected imaging of amorphous materials can reveal”, Savannah, GA (8/2004). (I was unable to attend at the last minute.)

(71)      “Extracting the “signal” from structurally noisy material”, NIRT Workshop on Nanoscale Materials, Tempe, AZ (12/2004).

 

Patents

(1)     D. E. W. Vaughan, K. G. Strohmaier, M. M. J. Treacy and J. M. Newsam, “Crystalline Zeolite ECR-35 and a Method for Producing Same”, US Patent Number 5,116,590 May 26, 1992.

(2)     M. J. Higgins. A. Krishnan, M. M. J. Treacy and S. Bhattacharya, “Reduction of imprint in ferroelectric devices using a depoling technique”, US Patent Number 6,294,393, September 25, 2001.

 

 

Software

(1)     J. M. Newsam and M. M. J. Treacy, “ZeoFile: A Stack of Zeolite Structure Types” - HyperCard Stack for Macintosh, containing an interactive zeolite structure database, with diffraction analysis software.

(2)     M. M. J. Treacy, M. W. Deem and J. M. Newsam “DIFFaX: A computer Program for Calculating Diffraction From Faulted Crystals” - a FORTRAN Program for simulating peak broadening in diffraction patterns in the presence of stacking faults.

 

 

Unpublished Company Reports

IBM

(1)     P. E. Batson and M. M. J. Treacy, “Bulk and Surface Plasmon Charge Location in Small Aluminum Spheres“, IBM Research Report, RC 8349 (#36313) (1980).

 

EXXON

(1)        M. M. J. Treacy and J. J. Steger, “Influence of Crystallite Size on Catalytic Performance of One Dimensional Zeolites”, CR.24BU.83, (1983).

(2)        A. J. Jacobson, J. T. Lewandowski, M. M. J. Treacy and J. W. Johnson, “Synthesis, Characterization and Reactions of the Layered Perovskites K[Ca2Na n-3Nb nO3n-1], n = 3 to 7”, CR.8BT.85, (1985).

(3)        M. M. J. Treacy and A.K. Ghosh, “Z Contrast Study of Pt Agglomeration as a Deactivation Mechanism of K-Zeolite L Catalyst”, CR.17BF.85, (1985).

(4)        A. K. Ghosh, M. M. J. Treacy and J. J. Steger, “Pt Agglomeration in KL Zeolite With Time on Oil”, CR.69BF.85, (1985).

(5)        J. Y. Koo, M. M. J. Treacy and J. C. Scanlon, “Lattice Imaging and Analytical Electron Microscopy Study of Pt Particles in Spent Pt-KL Zeolite Catalyst”, CR.4BF-X.85, (1985).

(6)        J. Y. Koo and M. M. J. Treacy, “Electron Microscopy Characterization of Pt/KL Zeolite Catalysts”, CR.41BF.86, (1985).

(7)        M. M. J. Treacy and J. Y. Koo, “Microanalysis of K-Zeolite L by Energy Dispersive X-Ray Spectroscopy in the Transmission Electron Microscope”, CR.22BF.85, (1985).

(8)        M. M. J. Treacy and S. B. Rice, “The Measurement of Particle Sizes in the STEM Using High-Angle Annular Detector Image Intensities”, CR.44BF.86, (1986).

(9)        M. M. J. Treacy, R. C. Haushalter and S. B. Rice, “Transmission Electron Microscopy Study of the Reaction of Sn94- Zintl Ions with Single Crystal Au Films”, (1986).

(10)      J. M. Newsam and M. M. J. Treacy, “Proceedings of the Fifth Exxon Zeolite Symposium”, CR.69BF.86.

(11)      G. M. Brown, J. H. Butler, C. B. deGruyter, M. M. Disko, S. B. Rice and M. M. J. Treacy, “Conventional and Scanning Transmission Electron Microscopy Study of HF–2 Exar Catalyst Extrudates”, CR.4BF-X.86.

(12)      M. M. J. Treacy, J. M. Newsam, W. T. Koetsier and C. B. de Gruyter, “Structural Characterization of Zeolite Beta”, CR.2B.88 April 1988

(13)      C. B. de Gruyter, J. P. Verduijn, C. W. M. van Oorschot, S. B. Rice and M. M. J. Treacy, “Crystal Defects and Channel Blockage in Zeolite L”, CR.20BF.88 January 1989.

(14)      M. M. J. Treacy, J. M. Newsam and M. W. Deem, “Diffraction from Zeolites Containing Planar Faults”, CR.9BT.88 January 1989

(15)      M. M. J. Treacy, J. M. Newsam, R. A. Beyerlein, D. E. W. Vaughan and S. B. Rice, "The Structure of Zeolite CSZ-1: An Analysis of the Propagation of Stress in Platelet Crystals" CR.3BT.89 March 1989.

(16)      S. B. Rice and M. M. J. Treacy, “Catalyst Particle Sizes from Rutherford Scattered Intensities”, CR11BF.88, May 1988.

 

NECI

(1)        T. Ebbesen, M. M. J. Treacy and M. E. Bisher, “Elasticity of Carbon Nanotubes”, TN# 95-012N, (1995).

(2)        M. M. J. Treacy, “Thin overlayers of a low-dielectric material can greatly reduce the effective dielectric constant of a thicker high-dielectric material”, sent to NEC Japan (1994).

(3)        M. M. J. Treacy, “Dynamical diffraction and anomalous light transmission in thin film optical gratings”, TR# 98-033 (1998).

(4)        M. M. J. Treacy, “Zeolite families and their faulty relatives”, TR# 98-058 (1998).

(5)        M. J. Higgins, A. Krishnan, M. M. J. Treacy and S. Bhattacharaya, “Writing and reading submicron features on ferroelectric thin films”

(6)        M. M. J. Treacy, “Anomalous Transmission in Thin Film Gratings” TR# 99-027 (1999).

(7)        M. M. J. Treacy, “Transmission Anomalies in Hole Arrays: a Diffraction Explanation” TR# 99-007N (1999).

(8)        M. M. J. Treacy, “A Simple Diffraction Explanation of the Anomalous Light Transmission Properties of Thin Film Optical Gratings” TR# 99-001N (1999).

(9)        M. M. J. Treacy, “Elastic Relaxation Phenomena in Thin-Film Ferroelectrics” TR# 99-042 (1999).

(10)      M. M. J. Treacy, A. Krishnan, P. Chandra and S. Bhattacharya, “Charge on Ferroelectric Domain Walls” TR# 99-048 (1999).

(11)      M. M. J. Treacy, “Pulsed Dynamical Diffraction in Metallic Optical Gratings” TR# 99-125 (1999).

(12)      M. M. J. Treacy, A. Krishnan and P. Chandra, “High-Field Charge Induction and Domain Wall Motion in Ferroelectrics” TR# 99-178 (1999).

(13)      A. Krishnan, M. M. J. Treacy, M. E. Bisher, P. Chandra and P. B. Littlewood,, “Displacement Charge Patterns in Ferroelectrics” TR# 99-148 (1999).

(14)      M. J. Higgins, A. Krishnan, S. Bhattacharya and M. M. J. Treacy, “Reduction of Imprint in Ferroelectric Capacitors Using a Simple Depoling Technique” TR# 99-001N (2000).

(15)      M. M. J. Treacy, “Reification or Rayification? Surface Plasmon and Diffraction Models of the Transmission Anomalies in Metallic Hole Arrays” TR# 99-011N (2000).

(16)      M. M. J. Treacy, “Surface Braggons Propagate Light Through Hole Arrays, and Surface Plasmons Block Light Transmission” TR# 99-175 (2000).

(17)      P. M. Voyles, M. M. J. Treacy, H. C. Jin, J. R. Abelson, J. M. Gibson, S. Guha and R. S. Crandall, “Comparative Fluctuation Microscopy Study of Medium-Range Order in Hydrogenated Amorphous Silicon Deposited by Various Methods” TR# 2000-050 (2000).

(18)      M. M. J. Treacy, “Nucleation and Growth of Carbon Cones: Graphitic Growth Modes on Large Carbon Rings” TR# 2000-110 (2000).

(19)      A. Krishnan, M. M. J. Treacy, M.E. Bisher, P. Chandra, P. B. Littlewood, “Energetics of Charged Ferroelectric Domain Walls”, TR# 2000-134 (2000).

(20)      M. J. Higgins, A. Krishnan, M. M. J. Treacy and S. Bhattacharya, “Writing and Reading Submicron Features on Ferroelectric Thin Films”, TR# 2000-142 (2000).

(21)      M. J. Higgins, A. Krishnan, M. M. J. Treacy and S. Bhattacharya, “Imaging Ferroelectric Hysteresis in MOCVD and Sol-Gel PZT Thin Films” TR# 2000-157 (2000).

(22)      M. M. J. Treacy, “Do surface plasmons enhance transmission in thin metallic hole arrays?”
TR#2001-024 (2001).

(23)      K.T. Park, M.M.J. Treacy, M.E. Bisher, “Optical Microscopy Evidence For Increased Domain Jamming With Cycle Time in Ferroelectric Barium Titanate”, TR# 2001-006N (2001).

(24)      K. T. Park, M.M.J. Treacy, M.E. Bisher, “Ultra-Violet Light Reduces Domain Jamming in Ferroelectric Barium Titanate” TR# 2001-008N (2001).

(25)      M. M. J. Treacy, “Oxide Electrodes Can Provide Stress-Relief in Ferroelectrics” TR# 2001-007N (2001).

(26)      S. Bhattacharya and M. M. J. Treacy, “A simple mechanical model of fatigue in ferroelectric memories” (2002).

(27)      S. Bhattacharya, M. J. Higgins, K.-T. Park and M. M. J. Treacy, “Aging ‘Phases’ of a ferroelectric capacitor.” TR#2002-  (2002).

 

Published Software

 

J. M. Newsam & M. M. J. Treacy, “ZeoFile: A Stack of Zeolite Structure Types” - HyperCard Stack for Macintosh, interactive zeolite structure database, with diffraction analysis software.

M. M. J. Treacy, M. W. Deem & J. M. Newsam “DIFFaX: a FORTRAN Program for simulating peak broadening in diffraction patterns from crystals that contain stacking faults”.

 

Teaching

(1)        (2001-2004) “Reach For The Stars”. Astronomy coach for two students at Plainsboro, NJ, Middle School. They competed in the NJ qualifying tournament and the National Science Olympiad in 2002 (came 19th) and 2003 (came 10th).

(2)        Fall 2003. PHY132 at ASU. Taught lab class on Electricity & Magnetism. Acting T.A. to John Spence.

(3)        Fall 2003. PHY241. Substitute lecturer for D. J. Smith. 2 lectures.

(4)        Spring 2004. PHY241 at ASU. Lecture course. 45 50-minute lectures on Thermodynamics, Optics and Modern Physics.

(5)        Guest Lecture (75 minutes) for course on Nanomaterials organized by T. Picraux and D. J. Smith. Lecture Title was “Synchrotron X-ray and Neutron Scattering”.

(6)        Fall 2004. PHY241 at ASU. Lecture course. 45 50-minute lectures on Thermodynamics, Optics and Modern Physics.

(7)        ASU Winter School on High Resolution Electron Microscopy, taught Imaging Theory 1 (Jan 2005).

(8)        Spring 2005. PHY241 at ASU. Lecture course. 45 50-minute lectures on Thermodynamics, Optics and Modern Physics.

 

Other

(1)     M. M. J. Treacy,
The Assassination of President Kennedy: The Facts Among the Fictions.
A summary of the JFK Assassination evidence, plus a summary of personal findings. The study was motivated by my initial suspicion that there had to be a vast conspiracy. It became clear that most (if not all) of the conspiracy theories arise from a basic inability to evaluate evidence. I conclude that Oswald was indeed the lone assassin, the “magic bullet” theory is probably correct, and that there is no reliable evidence of a conspiracy. Privately circulated (1992).

(2)        M. M. J. Treacy,
Influence of Dice Bias on the Game of Craps.
The dimples on the faces of some die bias the “6” face, since, being the one with the most dimples, it is the lightest face. In the game of craps this bias is found to favor the gamblers, but not quite enough to swing the odds in the gambler’s favor. (Real casinos do not use dice with dimples.) I develop a simple model accounting for the dice bias, and test it extensively by experiment. Privately circulated (1993).

(3)        M. M. J. Treacy
DIFFaX

Manual for the DIFFaX
computer program. 115 pages. (1990 – 2003).