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- Single Crystal Structure Analysis
- Working with good quality single crystal material having dimensions of 10 to 500
microns, a structural analysis will provide the bond lengths and angles in the crystalline
solid as well as the packing of the material. It has been said that this technique
is the "ultimate analytical tool" since exact atomic positional relationships
can be determined to within 0.001 angstroms.
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- Identification of Materials
- Many times a synthesis results only in fine grained powder material. It is common
practice to take a standard powder diffraction pattern of the material and compare the
pattern against our on-line database using computer-aided search/match routines.
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- Specialized Powder Diffraction
- Several other techniques for powder material are also available.
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- Low temperature powder diffraction is used for examining materials in the range of 20 to
250 Kelvin.
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- High temperature powder diffraction is applied in the range of 300 to 1300 Kelvin.
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- Pole figure analysis is used for determining preferred orientations in powders or
powder-like materials, such as drawn or worked metals.
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- Thin film analysis provides information on thin film deposits, usually on silicon
wafers.
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- Crystal Orientation
- If the exact orientation of a specimen of single crystal material is required, a
back-reflection Laue camera is available. Together with in-house software,
orientations to within 1 degree are attainable.
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- Database Search/Browse
- Both the NIST Single Crystal Database and the ICDD Powder Diffraction Database are
available. Powerful Boolean search algorithms provide fast results in both
databases.
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