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Orientations of known larger single crystal samples, such as fragments of silicon wafers, or materials having large single crystal domains can be determined using the Back-Reflection Laue Camera together with in-house or commercially produced Laue indexing software.
Key Benefits
Capabilities
Short exposure photography is possible using the Polaroid Back-Reflection Laue Camera. After a few preliminary exposures for alignment of sample, a final aligned exposure is taken.
The in-house software Laue_Ndx for Windows is used to calculate a Back-Reflection Laue pattern of the known structure in a variety of orientations until a match to the observed pattern is produced. The software can then index each observed reflection on the film, thereby determining the absolute orientation of the specimen. Additional software, purchased from Multiwire Laboratories, has the capability of scanning in back-reflection photographs and automatically indexing the Laue pattern. |
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Send mail to tgroy@asu.edu with questions or comments about this web site.
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