Manufacturing

Weakly Correlated Profile Monitoring Based on Sparse Multi-Channel Functional Principal Component Analysis
Although several works have been proposed for multi-channel profile monitoring, two additional challenges are yet to be addressed: (i) …
Chen Zhang, Hao Yan, Seungho Lee, Jianjun Shi
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A Wavelet-Based Penalized Mixed-Effects Decomposition for Multichannel Profile Detection of In-Line Raman Spectroscopy
Modeling and analysis of profiles, especially high-dimensional nonlinear profiles, is an important and challenging topic in statistical …
Xiaowei Yue, Hao Yan, Jin Gyu Park, Zhiyong Liang, Jianjun Shi
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Multiple Profiles Sensor-Based Monitoring and Anomaly Detection
Generally, in an advanced manufacturing system hundreds of sensors are deployed to measure key process variables in real time. Thus it …
Chen Zhang, Hao Yan, Seungho Lee, Jianjun Shi
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Anomaly Detection in Images With Smooth Background via Smooth-Sparse Decomposition
In various manufacturing applications such as steel, composites, and textile production, anomaly detection in noisy images is of …
Hao Yan, Kamran Paynabar, Jianjun Shi
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Generalized Wavelet Shrinkage of Inline Raman Spectroscopy for Quality Monitoring of Continuous Manufacturing of Carbon Nanotube Buckypaper
Process monitoring and quality control is essential for continuous manufacturing processes of carbon nano- tube (CNT) thin sheets or …
Xiaowei Yue, Kan Wang, Hao Yan, Jin Gyu Park, Zhiyong Liang, Chuck Zhang, Ben Wang, Jianjun Shi
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Image-Based Process Monitoring Using Low-Rank Tensor Decomposition
Image and video sensors are increasingly being deployed in complex systems due to the rich process information that these sensors can …
Hao Yan, Kamran Paynabar, Jianjun Shi
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