Sparse-Learning

Image Decomposition-Based Sparse Extreme Pixel-Level Feature Detection Model with Application to Medical Images
Pixel-level feature detection from images is an essential but challenging task encountered in domains such as detecting defects in …
Geet Lahoti, Jialei Chen, Xiaowei Yue, Hao Yan, Chitta Ranjan, Zhen Qian, Chuck Zhang, Ben Wang
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Real-Time Detection of Clustered Events in Video-Imaging Data with Applications to Additive Manufacturing
The use of video-imaging data for in-line process monitoring applications has become more and more popular in the industry. In this …
Hao Yan, Marco Grasso, Kamran Paynabar, Bianca Maria Colosimo
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AKM2D: An Adaptive Framework for Online Sensing and Anomaly Quantification
In point-based sensing systems such as coordinate measuring machines and laser ultrasonics where complete sensing is impractical due to …
Hao Yan, Kamran Paynabar, Jianjun Shi
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Dynamic Multivariate Functional Data Modeling via Sparse Subspace Learning
Multivariate functional data from a complex system are naturally high-dimensional and have complex cross-correlation structure. The …
Chen Zhang, Hao Yan, Seungho Lee, Jianjun Shi
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Weakly Correlated Profile Monitoring Based on Sparse Multi-Channel Functional Principal Component Analysis
Although several works have been proposed for multi-channel profile monitoring, two additional challenges are yet to be addressed: (i) …
Chen Zhang, Hao Yan, Seungho Lee, Jianjun Shi
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Anomaly Detection in Images With Smooth Background via Smooth-Sparse Decomposition
In various manufacturing applications such as steel, composites, and textile production, anomaly detection in noisy images is of …
Hao Yan, Kamran Paynabar, Jianjun Shi
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Generalized Wavelet Shrinkage of Inline Raman Spectroscopy for Quality Monitoring of Continuous Manufacturing of Carbon Nanotube Buckypaper
Process monitoring and quality control is essential for continuous manufacturing processes of carbon nano- tube (CNT) thin sheets or …
Xiaowei Yue, Kan Wang, Hao Yan, Jin Gyu Park, Zhiyong Liang, Chuck Zhang, Ben Wang, Jianjun Shi
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